American Patents LLC v. Mediatek, Inc. et al

Western District of Texas, txwd-6:2018-cv-00339

Ex. 7 [IEEE Authoritative Dict. of IEEE Stds. Terms]

Interested in this case?

Current View

Full Text

EXHIBIT 7. Case 0113199 DA Decarent 167-7 Filed 10/25/19 Page 2 of 9 - ILLE 100 THE AUTHORITATIVE DICTIONARY OF ZEE STANDARDS TERMS SEVENTH EDITION IEEE Published by Standards Information Network IEEE Press IEEE believes the information in this publication is accurate as of its publication date; such information is subject to change without notice. IEEE is not responsible for any inadvertent errors. Other tradenames and trademarks in this document are those of their respective owners. The Institute of Electrical and Electronics Engineering, Inc. 3 Park Avenue, New York, NY, 10016-5997, USA Copyright © 2000 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published December 2000. Printed in the United States of America. No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. To order IEEE Press publications, call 1-800-678-IEEE. Print: ISBN 0-7381-2601-2 SP1122 See other standards and standards-related product listings at: http://standards.ieee.org/ The publisher believes that the information and guidance given in this work serve as an enhancement to users, all parties must rely upon their own skill and judgement when making use of it. The publisher does not assume any liability to anyone for any loss or damage caused by any error or omission in the work, whether such error or omission is the result of negligence or any other cause. Any and all such liability is disclaimed. This work is published with the understanding that the IEEE is supplying information through this publication, not attempting to render engineering or other professional services. If such services are required, the assistance of an appropriate professional should be sought. The IEEE is not responsible for the statements and opinions advanced in this publication. Library of Congress Cataloging-in-Publication Data IEEE 100: the authoritative dictionary of IEEE standards terms.—7th ed. p. cm. ISBN 0-7381-2601-2 (paperback: alk. paper) 1. Electric engineering-Dictionaries. 2. Electronics-- Dictionaries. 3. Computer engineering-Dictionaries. 4. Electric engineering—Acronyms. 5. Electronics — Acronyms. 6. Computer engineering-Acronyms. I. Institute of Electrical and Electronics Engineers. TK9 .128 2000 621.3'03—dc21 00-050601 Case 6.18-cv-20329 APA DOCUNTEN1071 Filed 10/25/19 Page 4 of 9. & DATE TAO S SIGN 277 deca deadlock deadlock (1) A sin pended because two or more de awaiting resources assigned to the 30 inck (1A situation in which computer processing is sus use two or more devices or processes are each sources assigned to the other(s). For example, a iation in which computer program A, with an exclusive on record X, asks for a lock on record Y, which is al- located to computer program B. Likewise, program Bie For exclusive control over record X before giving up con- of record Y. Synonym: deadly embrace. See also: lockout. (C) 610.5-1990w, 610.12-1990 A state that occurs when modules are awaiting actions that an only be performed by those waiting, and those waiting cannot perform the actions. (C/BA) 10857-1994, 896.3-1993w, 1014.1-1994w, 896.4-1993w deadly embrace See: deadlock. dead man See: anchor log. deadman A pressure- or activity-actuated alertness device to detect inattention or disability of a train operator. Note: A deadman can be contained within the master controller main handle grip, obtained by a separate foot switch, or obtained through an alertness type function. The device, when not properly maintained in an operational condition, will result in an emergency or full service brake application. (VT) 1475-1999 deadman's handle A handle of controller or master switch that is designed to cause the controller to assume a preassigned operating condition if the force of the operator's hand on the handle is released. See also: electric controller. (IA/ICTL/IAC) [60] deadman's release The effect of that feature of a semiautomatic or nonautomatic control system that acts to cause the con- trolled apparatus to assume a preassigned operating condition if the operator becomes incapacitated. See also: control. (IA/ICTL/IAC) [60] dead-metal part (power and distribution transformers) A part, accessible or inaccessible, which is conductively con- nected to the grounded circuit under conditions of normal use of the equipment. (PE/TR) C57.12.80-1978 dead reckoning (DR) (1) (navigation aid terms) The deter- mining of the position of a vehicle at one time with respect to its position at a different time by the application of vectors representing courses and distances. (AES/GCS) 172-1983w (2) A method for the estimation of the position/orientation of an entity based on a previously known position/orientation and estimates of time and motion. (DIS/C) 1278.1-1995 dead room (audio and electroacoustics) Those locations com- pletely within the coverage area where the signal strength is below the level needed for reliable communication. See also: mobile communication system. (VT/ACO) (37) dead state A node state that is reflected by the value of 3 in the STATE.CLEAR.state field. A node enters the dead state when a fatal error has been detected and the node is connected but no longer operational. Note that the severest errors could leave the node in a broken state, with its registers undefined, rather than indicating a dead state. (C/MM) 1212-1991s dead tank switching device A switching device in which a Vessel(s) at ground potential surrounds and contains the in- terrupter(s) and the insulating medium. (SWG/PE) C37.100-1981s dead time (1) (A) (of a circuit breaker on a reclosing operation) The interval between interruption in all poles on the opening stroke and reestablishment of the circuit on the reclosing stroke. Notes: 1. In breakers using arc-shunting resistors, the following intervals are recognized and the one referred to should be stated: Dead time from interruption on the primary arcing contacts to reestablishment through the primary arcing contacts; Dead time from interruption on the primary arcing contacts to reestablishment through the secondary arcing con- tacts; Dead time from interruption on the secondary arcing contacts to reestablishment on the primary arcing contacts; Dead time from interruption on the secondary arcing contacts to reestablishment on the secondary arcing contacts. 2. The dead time of an arcing fault on a reclosing operation is not necessarily the same as the dead time of the circuit breakers involved, since the dead time of the fault is the interval during which the faulted conductor is de-energized from all termin- als. (B) The time during which the ADC is unable to process input pulses because it is processing a previous pulse. (SWG/PE/NI) C37.100-1992, N42.14-1991 (2) (navigation) The time interval in an equipment's cycle of operating during which the equipment is prevented from pro- viding normal response. For example, in a radar display, the portion of the interpulse interval which is not displayed; or, in secondary radar, the interval immediately following the transmission of a pulse relay during which the transponder is insensitive to interrogations. (AES/RS) 686-1982s (3) (sodium iodide detector) The time after a triggering pulse during which the system is unable to retrigger. (NI) N42.12-1994 (4) The time interval after the start of an essentially full-am- plitude pulse during which a radiation detector is insensitive to further ionizing events. See also: recovery time. (NI/NPS) 309-1999 dead-time correction (radiation counters) A correction to the observed counting rate to allow for the probability of the oc- currence of events within the dead time of the system. See also: anticoincidence. (ED) [45] dead time tt (sodium iodide detector) The time after a trig- gering pulse during which the system is unable to retrigger. (NI) N42.12-1980s, N42.12-1994 dead zone The period(s) in the operating cycle of a machine during which corrective functions cannot be initiated. (IA/ICTL/IAC) [60] deassembler* See: disassembler. * Deprecated. deauthentication The service that voids an existing authenti- cation relationship. (C/LM) 8802-11-1999 deblock To separate the parts of a block. Synonym: unblock. Contrast: block. (C) 610.12-1990, 610.5-1990w deblurring See: sharpening. debug (1) To examine or test a procedure, routine, or equipment for the purpose of detecting and correcting errors. (COM) [49] (2) (computers) To detect, locate, and remove mistakes from a routine or malfunctions from a computer. See also: trou- bleshoot. (C) [20], [85] (3) (software) To detect, locate, and correct faults in a com- puter program. Techniques include use of breakpoints, desk checking, dumps, inspection, reversible execution, single-step operation, and traces. (C) 610.12-1990 debugging (1) The operation of an equipment or complex item prior to use to detect and replace parts that are defective or expected to fail, and to correct errors in fabrication or assem- bly. See also: reliability. (MIL/R) [2], [29] (2) (software) The process of locating, analyzing, and cor- recting suspected faults. See also: testing. (C/SE) 729-1983 debugging model See: error model. Debye length (Lp) That distance in a plasma over which a free electron may move under its own kinetic energy before it is pulled back by the electrostatic restoring forces of the polar- ization (ion) cloud surrounding it. Over this distance, a net charge density can exist in an ionized gas. The Debye length is given by: Lp = 6.9 where T. = the electron temperature Ne = the electron number density (AP/PROP) 211-1997 deca A prefix indicating ten. Synonym: deka. (C) 1084-1986w fire-resistive construction 438 first-in, first-out fire-resistive construction A method of construction that pre- vents or retards the passage of hot gases or flames as defined by the fire-resistance rating. (EEC/PE) [119] fire-retardant coatings Material applied along the length of cables or in localized areas, as deemed necessary, to retard the flame propagation properties of cables in trays. (PE/IC) 848-1996 fired tube (nonlinear, active, and nonreciprocal waveguide components) (microwave gas tubes) The condition of the tube during which a radio frequency glow exists at either the resonant gap, the resonant window, or both. See also: gas tube. (MTT/ED) 457-1982w, (45), 161-1971w fireproofing (of cables) The application of a fire-resistant cov- ering. (NESC) C2-1997 firing angle See: angle of retard, firing power (nonlinear, active, and nonreciprocal wave- guide components) The radio-frequency (rf) power level above which a gas tube becomes nonlinear. See also: gas tube. (MTT) 457-1982w firm capacity (1) (electric power supply) (purchase or sales) That firm capacity that is purchased, or sold, in transactions with other systems and that is not from designated units, but is from the over-all system of the seller. Note: It is understood that the seller provides reserve capacity for this type of trans- action. See also: generating station. (PE/PSE) [54] (2) Capacity that is purchased, or sold, at the highest level of system generation availability. It is understood that the seller treats this type of transaction as a demand obligation. (PE/PSE) 858-1993w firm power (1) (power operations) Power intended to be avail- able at all times during the period covered by a commitment, even under adverse conditions. (PE/PSE) 858-1987s (2) (emergency and standby power) Power intended to be always available, even under emergency conditions. See also: generating station. (IA/PE/T&D/PSE) 446-1987s, [10] firm transfer capability (electric power supply) (transmis- sion) The maximum amount of power that can be inter- changed continuously, over an extended period of time. See also: generating station. (PE/PSE) [54] firmware (1) (software) The combination of a hardware device and computer instructions and data that reside as read-only software on that device. Notes: 1. This term is sometimes used to refer only to the hardware device or only to the computer instructions or data, but these meanings are deprecated. 2. The confusion surrounding this term has led some to suggest that it be avoided altogether. (C) 610.12-1990 (2) (supervisory control, data acquisition, and automatic control) Hardware used for the nonvolatile storage of instruc- tions or data that can be read only by the computer. Stored information is not alterable by any computer program. See also: station. (SWG/SUB/PE) C37.1-1987s, C37.100-1992 (3) (watthour meters) A register control program stored in read-only memory and considered to be an integral part of the register. (ELM) C12.13-1985s (4) (electromechanical watthour meters) A program to con- trol the solid-state demand register that is stored in read-only memory and considered to be an integral part of the register that cannot be changed in its operating environment. (ELM) C12.15-1990 (5) The combination of software and data that reside on read- only memory. (PE/NP) 7-4.3.2-1993 (6) A program, typically stored in read-only memory, that controls a computer from the time that it is turned on until the time that the primary operating system assumes control of the computer. (C/BA) 1275-1994 (7) The combination of a hardware device and computer in- structions and data that reside as read-only software on that device. Notes: 1. This term is sometimes used to refer only to the hardware device or only to the computer instructions or data, but these meanings are deprecated. 2. The confusion surrounding this term has led some to suggest that it be avoided altogether. (C) 610.10-1994w (8) The combination of a hardware device and computer. structions and/or computer data that reside as read-only ware on the hardware device. (C/SE) J-STD-016-1005 firmware device driver A device driver intended for use Tor use by firmware. Contrast: operating system device driver. Seea device driver. (CBA) 1275-1994 first-bit access time (of a BORAM) The time interval betu the application of addressing and enabling signals and ! availability at an output of the first bit from a block of a (ED) 641-1987 first-class object An object that can be the value of a variah or can be stored in a data structure. In Scheme, first-cla objects have unlimited extent. See also: extent. (C/MM) 1178-1990 first-come, first-served See: first-in, first-out. first contingency incremental transfer capability (power erations) The amount of power, incremental above norma base power transfers, that can be transferred over the trane mission network in a reliable manner, based on the following conditions: a) With all transmission facilities in service, all facility load- ings are within normal ratings, and all voltages are within normal limits; b) The bulk power system is capable of absorbing the dy. namic power swings and remaining stable following a dis- turbance resulting in the loss of any single generating unit. transmission circuit or transformer; c) After the dynamic power swings following a disturbance resulting in the loss of any single generating unit, trans- mission circuit, or transformer, but before operator-di- rected system adjustments are made, all transmission fa. cility loadings are within emergency ratings, and all voltages are within emergency limits. (PE/PSE) 858-1987 first dial (register) That graduated circle or cyclometer wheel, the reading on which changes most rapidly. The test dial or d ials, if any, are not considered. See also: watthour meter. (EEC/PE) (119) first-ended, first-out A queueing technique for concurrent pro cesses in which items are retrieved from the queue based on the time at which the item is placed completely in the queue. That is, the item whose final segment is placed in the queue before those of all other items, will exit the queue before those other items. Note: Often used in message queueing applica- tions. (C) 610.5-1990w first Fresnel zone (data transmission) In optics and radio com- munication, the circular portion of a wave front transverse to the line between an emitter and a more distant point where the resultant disturbance is being observed, whose center the intersection of the front with the direct ray and whose radius is such that shortest path from the emitter through me periphery to the receiving point is one-half wave longer than the ray. Note: A second zone, a third, etc., are defined by successive increases of the path by half-wave incremn Ultant disturbance is uith the direct ray cough the (PE) 599-1985w first generation A period during the evolution of the computers in which computers were designed around va tubes. Note: Introduced in 1949, first generation com were thought to have been the state of the art from 1959, when the transistor was developed. See alsoru eration; fourth generation; fifth generation; seco ee also: third ein tion. generation; second genera- (C) 610.10-1994 first-generation language See: machine language. first-in, first-out (A) A technique for managing to which additions and deletions are to be made, appended to one end of a list and retrieved fro end. See also: queue. (B) Pertaining to a system next item to exit the system is the item that he system for the longest time. Synonym: first-come Contrast: last-in, first-out. managing a set of items re to be made; items are u retrieved from the other & to a system in which the Item that has been in the .hirst-come, first-served (C) 610,5-1990 Akiwa Watu mes WWWWWW WWWW initial state Case 6:18-cv-00339-ADA Doéliment 167-7 Filed 10/25/19 Pagemang of9 input angle initial state The values assumed by the state variables of a sys- ink jet printer A nonimpact printer in which the characters are (though necessary, to or tem, component, or simulation at the beginning of some spec- formed by projecting a jet of ink droplets onto paper. eration), is not considere ified duration of time. Contrast: final state. (C) 610.10-1994w sidered a relay input, but (C) 610.3-1989w in-line (monitoring radioactivity in effluents) A system where initial symmetrical ground fault current (safety in ac sub- the detector assembly is adjacent to or immersed in the total (5) In an IDEFO model, ť station grounding) The maximum root-mean-square (Ims) effluent stream. (NI) N42.18-1980r tion into output. value of symmetrical fault current after the instant of a ground in-line code A sequence of computer instructions that is phys- A pin or port that sha fault initiation. As such, it represents the ms value of the ically contiguous with the instructions that logically precede connected net or intercon symmetrical component in the first half-cycle of a current and follow it. (C) 610.12-1990 wave that develops after the instant of fault at time zero. Gen- in-line connection Connection of two heater cables together input angle (gyros) The ani erally, lo+) = 31," where I (0+) = initial symmetrical ground electrically in series or parallel on the same pipe. an input axis. fault current l" = rms value of zero-sequenced symmetrical (IA) 515-1997 input area An area of stora current that develops immediately after the instant of fault inline recovery Recovery performed by resuming a process at initiation; that is, reflecting the subtransient reactances of ro- a point preceding the occurrence of a failure. Contrast: back- tating machines contributing to the fault. Note: Elsewhere in input argument The desig ote: Elsewhere in ward recovery; forward recovery. (C) 610.5-1990w the guide, this initial symmetrical fault current is shown in an inner jacket A jacket that is extruded over the cable care cov ment that will always ha abbreviated notation, as If, or is referred to only as 3i0. The operation. Contrast: outp ering to provide additional dielectric strength when it is underlying reason for this latter notation is that, for purposes input arrow An arrow or a needed between the conductors and the shield. An inner jacket of this guide, the initial symmetrical fault current is assumed may be used in cables that are used for direct burial and also input, i.e., an object type: to remain constant for the entire duration of the fault. where high ground potential rise is to be withstood. See also: by a function into output (T&D/PE) 563-19781 cable jacket (PE/PSC) 789-1988w is attached to the left side initial transient recovery voltage (ITRV) A component of the inner storage See: internal storage. loput assertion (software) transient recovery voltage that appears in the very short time I output The nominal load current for which the unit-under- or more conditions that p. immediately after current interruption. The initial transient test output voltage is required to be maintained within the to be valid. Contrast: ou recovery voltage is a result of traveling waves on the substa- specified operational limits; the value should be between the also: inductive assertion 1 tion bus adjacent to the circuit-switching device. minimum and maximum values. (PEL) 1515-2000 Input axis (LA) (1) (accele (SWG/PE) C37.100-1992 inoperable time The part of down-time in which all environ which an input causes a n initial units space (1) The portion of the initial node space that mental conditions are satisfied, during which a device would is adjacent to but above the initial register space. When its not yield correct results if it were operated. (2) (gyros) The axis about size is sufficient, unit architectures are expected to be located (C) 610.10-1994 a maximum output. For a within this space. (C/MM) 1212-1991s inorder traversal The process of traversing a binary tree in a normal to the spin axis. F (2) A portion of initial node space with a base address of recursive fashion as follows: the left subtree is traversed in perpendicular to a plane e FFFF F000 080016. This places initial units space adjacent to order, then the root is visited, then the right subtree is tra- and above initial register space. The CSR's and other facilities Versed in order. Synonym: symmetric traversal. Contrast: input-axis misalignment (: defined by unit architectures are expected to lie within this preorder traversal; postorder traversal. See also: converse in between an input axis and space. (C/MM) 1394a-2000 order traversal. (C) 610.5-1990 when the device is at a nul initial unloaded sag The sag of a conductor prior to the appli- in-phase spring rate (inertial sensors) (dynamically tuned angle is unambiguous, but cation of any external load. (NESC) C2-1997 gyro) The residual difference, in a dynamically tuned gyro, convention should always initial unloaded tension The longitudinal tension in a conductor between the dynamically induced spring rate and the flexure both direction cosines ar prior to the application of any external load. spring rate. (PE/AES/PSE/GYAC) 762-1987w, 528-1994 pending on the principal 1 (NESC) C2-1997 in-phase video One of a pair of coherent, bipolar video signals tions, differing both in s: initiating cause A cause that directly leads to the failure. derived from the RF or IF signal by a pair of synchronous sometimes used.) (SWG/PE) C37.10-1995 detectors with a 90° phase difference between the coherent input block (A) (test, mea: oscillator (coho) reference inputs used for each. Note: The en ment) A section of intern initiating relay A programming relay whose function is to con- in-phase component is often identified as I and the other of for the receiving and pro strain the action of dependent relays until after it has operated. the pair as quadrature video or Q. See also: quadrature video onym: input area. (B) (tes (SWG/PE) C37.100-1992 (AES) 686-1991 equipment) A block used initiation queue A DMA queue that is used primarily to pass in-plant system A communications system whose parts, includ urement, and diagnostic I/O transaction-initiation messages. (C/MM) 1212.1-1993 ing remote terminals, may be all situated in one building or words, considered as a uj initiator (1) The function that starts an I/O transaction-initia several buildings. Synonym: in-house system. e from an external source or tion/transaction-completion exchange by sending an initiation (C) 610.7-1995 internal storage of the com message to the responder. (C/MM) 1212.1-1993 input (1) (A) (data transmission) The data to be processed input buffer See: buffer. (2) The file service user that requests FTAM regime estab (B) (data transmission) The state or sequence of states a n loput buffer register A dat lishment. (C/PA) 1238.1-1994w curring on a specified input channel. (C) (data transmission) Le from an input unit such as injected current The current that flows through the test circuit The device or collective set of devices used for bringing dala disk and which then transf breaker from the voltage source of a current injection circuit into another device. (D) (data transmission) A channel for when this circuit is applied to the test circuit breaker. impressing a state on a device or logic element. (E) (data (SWG/PE) C37.100-1992, C37.081-1981r, C37.083-1999 transmission) The process of transferring data from an ex put capacitance (n-termi injected-current frequency (ac high-voltage circuit brea- cuit transfer capacitance b ternal storage to an internal storage. (PE) 599-1985 other terminals, except th kers) The frequency of the injected current (2) (A) (software) Pertaining to data received from an ex- gether. Note: This quantit (SWG/PE) C37.100-1992, C37.083-1999, C37.081-1981r ternal source. Contrast: output. (B) (software) Pertaining to interelectrode capacitances a device, process, or channel involved in receiving data from injection fiber See: launching fiber. all other electrodes except t an external source. Contrast: output. (C) (software) To re injection laser diode (ILD) (fiber optics) A laser employing a ceive data from an external source. Contrast: outpul tron-tube admittances. forward-biased semiconductor junction as the active medium. (D) (software) To provide data from an external source. Cor i nput channel A channel em Synonyms: diode laser; semiconductor laser. See also: chirp- trast: output. (E) (software) Loosely, input data. Contrast ample, to impress a state o ing; superradiance; active laser medium; laser.. output. (C) 610.12-1990 transfer data from an exteri (Std 100) 812-1984w (3) Pertaining to a device, process, or channel involved in the age unit. See also: input-01 injection time (ac high-voltage circuit breakers) The time reception of data. (C) 610.10-1994w the with respect to the power frequency current zero when the (4) (to a relay) A physical quantity or quantities to which the Input data (test pattern lang voltage circuit is applied, relay is designed to respond. Notes: 1. A physical quantity ten into a mem (SWG/PE) C37.081-19811, C37,083-1999, C37.100-1992 that is not directly related to the prescribed response of a relay W WWAAA .... . Method ANDRE Case 18-CV-000359-APA Decimen. 1677 med 10/2519 Page 7 of 9 & SIGN I SIGN MEIS & DATE 557 input/output model input angle (though necessary, to or in so eration), is not consider tion into output. an input axis. nation Stue at the CISE) 13 cessary, to or in some way affecting the relay op- is not considered part of input. 2. Time is not con- dered a relay input, but it is a factor in performance. (SWG/PE) C37.100-1992 on IDEFO model, that which is transformed by a func- (C/SE) 1320.1-1998 4 pin or port that shall only receive logic signals from a connected net or interconnect structure. (C/ DA) 1481-1999 onut angle (gyros) The angular displacement of the case about (AES/ GYAC) 528-1994 input area An area of storage reserved for input data. (C) 610.10-1994w targument The designation given to an operation argu- ment that will always have a value at the invocation of the operation. Contrast: output argument. (C/SE) 1320.2-1998 input arrow An arrow or arrow segment that expresses IDEFO Jinput, i.e., an object type set whose instances are transformed by a function into output. The arrowhead of an input arrow is attached to the left side of a box. (C/SE) 1320.1-1998 input assertion (software) A logical expression specifying one or more conditions that program inputs must satisfy in order to be valid. Contrast: output assertion; loop assertion. See also: inductive assertion method. (C) 610.12-1990 input axis (IA) (1) (accelerometer) The axis along or about which an input causes a maximum output. (AES/GYAC) 528-1994 (2) (gyros) The axis about which a rotation of the case causes a maximum output. For a conventional gyro, the input axis is normal to the spin axis. For an optical gyro, the input axis is perpendicular to a plane established by the light beams. (AES/GYAC) 528-1994 input-axis misalignment (accelerometer) (gyros) The angle between an input axis and its associated input reference axis when the device is at a null condition. (The magnitude of this angle is unambiguous, but when components are reported, the convention should always be identified. IEEE standards use both direction cosines and right-handed Euler angles, de- pending on the principal field of application. Other conven- tions, differing both in signs and designation of axes, are sometimes used.) (AES/GYAC) 528-1994 input block (A) (test, measurement, and diagnostic equip- ment) A section of internal storage of a computer, reserved for the receiving and processing of input information. Syn- onym: input area. (B) (test, measurement, and diagnostic equipment) A block used as an input buffer. (C) (test, meas- urement, and diagnostic equipment) A block of machine words, considered as a unit and intended to be transferred from an external source or storage or storage medium to the internal storage of the computer. (MIL) [2] input buffer See: buffer. input buffer register A data buffer register that accepts data from an input unit such as a magnetic tape drive or magnetic disk and which then transfers this data to internal storage. (C) 610.10-1994w input capacitance (n-terminal electron tubes) The short-cir- cuit transfer capacitance between the input terminal and all other terminals, except the output terminal, connected to gether. Note: This quantity is equivalent to the sum of the interelectrode capacitances between the input electrode and all other electrodes except the output electrode. See also: elec- tron-tube admittances. (ED) 161-1971w input channel A channel employed only for data input; for ex- ample, to impress a state on a device or logic element; or to transfer data from an external storage unit to an internal stor- age unit. See also: input-output channel; output channel. (C) 610.10-1994w Input data (test pattern language) The binary data that is writ- ten into a memory array. It is identified by the symbol "D." (TT/C) 660-1986w input device A device used to enter data into a computer system. Note: Commonly used input devices include light pens and keyboards. Synonym: input unit. Contrast: output device. See also: string device; cursor control device; logical input de- vice; graphical input device; graphic input device; pick de- vice; input-output device. (C) 610.10-1994w, 610.6-1991w, 1084-1986w input impedance (1) (analog computer) In an analog com- puter, a passive network connected between the input termi- nal or terminals of an operational amplifier and its summing junction. (C) 165-1977w (2) (at a transmission line port) (waveguide) The imped- ance at the transverse plane of the port. Note: This impedance is independent of the generator impedance. (MTT) 146-1980w (3) The impedance between the signal input of the waveform recorder and ground. (IM/WM&A) 1057-1994w (4) (of an antenna) The impedance presented by an antenna at its terminals. (AP/ANT) 145-1993 input jitter tolerance The maximum level of input jitter, spec- ified in terms of unit intervals peak to peak, that does not result in an onset of errors. (COM/TA) 1007-1991r input leakage current (amplifiers) A direct current (of either polarity) that would flow in a short circuit connecting the input terminals of an amplifier. (IM) 311-1970w input limiter A limiter circuit employing biased diodes in the amplifier input channel, that operates by limiting current en- tering the summing junction. (C) 610.10-1994w input limits (accelerometer) (gyros) The extreme values of the input, generally plus or minus, within which performance is of the specified accuracy. (AES/GYAC) 528-1994 input loopback Loopback of output from one function to be input for another function in the same diagram. (C/SE) 1320.1-1998 input media Media that are employed as input; for example, punched cards; magnetic disks. Contrast: output media. (C) 610.10-1994w input-output Pertaining to input, output, or both. (C) 610.10-1994w input-output area See: buffer. input-output bound (io bound) Pertaining to any process that performs input-output operations which take a long time rel- ative to the time of CPU operations performed. Contrast: compute-bound. (C) 610.10-1994w input-output channel A channel that handles the transfer of data between internal storage and peripheral equipment. Syn- onyms: data channel; computer channel. See also: input-out- put controller; selector channel; output channel; input chan- nel. (C) 610.7-1995, 610.10-1994w input-output characteristic (1) (transmission performance of telephone sets) Electric or acoustic output level as a function of the input level. (COM/TA) 269-1983s (2) The accompanying diagram shows the relationship be- tween the input-output characteristics of an accelerometer or gyro. (AES/GYAC) 528-1994 input-output circuit A circuit that connects a computer to an- other device. (C) 610.10-1994w input-output control electronics The electronics required to interface an input-output device to a central processing unit. (C) 610.10-1994w input-output controller (IOC) A controller that controls one or more input-output channels. Synonym: peripheral control- ler. See also: selector channel; input-output channel. (C) 610.7-1995, 610.10-1994w input-output coupling See: data coupling. input-output device A device through which data may be en- tered into a computer system, received from the system, or both. Synonym: input-output unit. See also: output device; input device. (C) 610.10-1994w input/output model See: black box model. test board test test test T CO test test test W] fo test test) test board A switchboard equipped with testing apparatus so arranged that connections can be made from it to telephone lines or central-office equipment for testing purposes. (COM) [48] test bus interface circuit (TBIC) A circuit module that allows an internal analog test bus in an integrated circuit to be iso- lated from or connected to the pins in the analog test access port (ATAP). See also: analog test access port. (C/TT) 1149.4-1999 test bypass A mode of testing whereby the safety group under test is designed to permit any one channel or load group to be maintained, tested or calibrated during power operation, without initiating a protective action of the safety group. (PE/NP) 338-1987r test cabinet (for a switchgear assembly) An assembly of a cabinet containing permanent electric connections, with cable connections to a contact box arranged to make connection to the secondary contacts on an electrically operated removable element, permitting operation and testing of the removable element when removed from the housing. It includes the nec- essary control switch and closing relay, if required. (SWG/PE) C37.100-1992 test call (telephone switching systems) A call made to deter- mine if circuits or equipment are performing properly. (COM) 312-1977w test cap A protective structure that is placed over the exposed end of the cable to seal the sheath or other covering com- pletely against the entrance of dirt, moisture, air, or other foreign substances. Note: Test caps are often provided with facilities for vacuum treatment, oil filling, or other special field operations. See also: live cable test cap. (T&D/PE) (10) test case (1) (software) A set of test inputs, execution condi- tions, and expected results developed for a particular objec- tive, such as to exercise a particular program path or to verify compliance with a specific requirement. (C/Std 100) 610.12-1990 (2) Documentation that specifies inputs, predicted results, and a set of execution conditions for a test item. (C/SE) 1012-1998, 610.12-1990 test case generator (software) A software tool that accepts as input source code, test criteria, specifications, or data structure definitions; uses these inputs to generate test input data; and, sometimes, determines expected results. Synonyms: test gen- erator; test data generator. See also: automated test generator. (C) 610.12-1990 test case specification (1) (software) A document that specifies the test inputs, execution conditions, and predicted results for an item to be tested. Synonyms: test specification; test de- scription. See also: test procedure; test report; test plan; test item transmittal report; test incident report; test log. (C) 610.12-1990 (2) A document specifying inputs, predicted results, and a set of execution conditions for a test item. (C/SE) 829-1998 test circuit breaker (ac high-voltage circuit breakers) The circuit breaker under test. (SWG/PE) C37.081-1981r, C37.083-19992, C37.100-1992 test connection (telephony) Two telephone sets connected to- gether by means of test loops and a feed circuit. (COM/TA) 269-1971w test control The functionality that directs and facilitates the ex- ecution of tests and the collection of data. (SCC20) 1226-1998 test coordinator A person typically responsible for organizing and scheduling tests; deciding how, when, and where the sys- tem and its components will be tested; and determining the test equipment that is needed. (SUB/PE) 1303-1994 test coverage The degree to which a given test or set of tests addresses all specified requirements for a given system or component. (C) 610.12-1990 test event test criteria The criteria that a system or component must meet in order to pass a given test. See also: acceptance criteria; pass/fail criteria. (C) 610.12-1990 test current See: watthour meter-test current. test current, continuous See: continuous test current. test current in alternating-current circuits (insulation tests) The normal current flowing in the test circuit as the result of insulation leakage and, in alternating-current circuits, is the vector sum of the inphase leakage currents and quadrature capacitive currents. (AES/ENSY) 135-1969w test current, long-time See: long-time test current. test current, short-time See: short-time test current. test data (1) Data from observations during tests. Note: All conditions should be stated in detail, for example, time, stress conditions and failure or success criteria. (R) (29) (2) (software) Data developed to test a system or system component. See also: test case; component; data; system. (C/SE) 729-1983 (3) (A) (station control and data acquisition) The recorded results of test. (B) (station control and data acquisition) A set of data developed specifically to test the adequacy of a computer run or system. They may be actual data taken from previous operations or artificial data created for this purpose. (SWG/PE/SUB) C37.100-1992, C37.1-1994, C37.1-1979 (4) Data that are entered into an electronic system of any kind (component, printed circuit assembly, subsystem, system) to verify the integrity of part or all of the system. Test data may be entered through function pins or test pins or both. (C/TT) 1149.4-1999 test data generator See: automated test generator; test case generator. test description See: test case specification. test design Documentation that specifies the details of the tes approach for a software feature or combination of software features and identifying the associated tests. (C/SE) 1012-1998 test design specification A document specifying the details of the test approach for a software feature or combination of software features and identifying the associated tests. (C/SE) 829-1998 test desk (telephone switching systems) A position equipped with testing apparatus so arranged that connections can be made from it to telephone lines or central office equipment for testing purposes. (COM) 312-1977 test documentation Documentation describing plans for, or re- sults of, the testing of a system or component. Types include test case specification, test incident report, test log, test plan, test procedure, test report. (C) 610.12-1990 test driver (software) A software module used to invoke a mod- ule under test and, often, provide test inputs, control and mon- itor execution, and report test results. Synonym: test harness. (C) 610.12-1990 test duration (nuclear power generating station) The elapsed time between the test initiation and the test termination. (PE/NP) 338-1987 test enclosure (for low-voltage ac power circuit breakers) A single-unit enclosure used for test purposes for a specific frame-size circuit breaker, which conforms to the manufac- turer's recommendation for minimum volume, minimum electrical clearances, effective areas and locations of venti: lation openings, and configuration of connections to termin. als. (SWG/PE) C37.100-1992 Test Equipment Description Language (TEDL) A standard- ized computer language used to describe the configuration of ATE systems. (ATLAS) 1226-1993 tester cycle See: vector. test event An action or group of actions performed on a partic- ular unit under test (UUT) to evaluate a parameter or char- acteristic. It is the process of initialization, stimulus, and measurement of the UUT. It includes one or more tests and occurs during a continuous period of time. Test events are test test i testi test al test Case 6:18-cv-00339-ADA Docume IEEE 1005/19 Page 9 of 9 The Authoritative Dictionary of IEEE Standards Terms Seventh Edition Your Dependable Source for IEEE Standardized Terminology The Authoritative Dictionary of IEEE Standards Terms is today's trustworthy resource for terminology in IEEE standards. In this newly updated edition, profes sional experts and students alike gain an in-depth understanding of the breadth of coverage of IEEE standards terms and definitions - not found in any other single source. 39 Rich in information, the seventh edition contains: • Nearly 35,000 terms and definitions from over 800 JEEE standards · An extensive, convenient acronym and abbreviation sections • A complete set of abstracts describing IEEE standards Equations and formulas in easy-to-read type What's more, ALL definitions are augmented by a combination of indispensable, Information, including: • Preferred and popular usage of each term Variations in meanings among different technical specialties,: Cross-indexing to related works Key explanatory notes that clarify terms when needed s: Field of application, for each entry along with the source of each term 2003 ISBN 0-7381-2601-2 0-73 X0024KCPDZ Used Good - The Authoritative Dict ionary of IEEE Standards Terms (IE EE 100), Seventh Edition 7"TOUT JOILUUIC"